? semiconductor components industries, llc, 2013 february, 2013 ? rev. 4 1 publication order number: ndf11n50z/d ndf11n50z n-channel power mosfet 500 v, 0.52 features ? low on resistance ? low gate charge ? esd diode ? protected gate ? 100% avalanche tested ? these devices are pb ? free, halogen free/bfr free and are rohs compliant absolute maximum ratings (t c = 25 c unless otherwise noted) rating symbol ndf unit drain ? to ? source voltage v dss 500 v continuous drain current, r jc (note 1) i d 12 a continuous drain current t a = 100 c, r jc (note 1) i d 7.4 a pulsed drain current, t p = 10 s i dm 44 a power dissipation, r jc p d 39 w gate ? to ? source voltage v gs 30 v single pulse avalanche energy, i d = 10 a e as 420 mj esd (hbm) (jesd22 ? a114) v esd 4000 v rms isolation voltage (t = 0.3 sec., r.h. 30%, t a = 25 c) (figure 14) v iso 4500 v peak diode recovery (note 2) dv/dt 4.5 v/ns continuous source current (body diode) i s 12 a maximum temperature for soldering leads t l 260 c operating junction and storage temperature range t j , t stg ? 55 to 150 c stresses exceeding maximum ratings may damage the device. maximum ratings are stress ratings only. functional operation above the recommended operating conditions is not implied. extended exposure to stresses above the recommended operating conditions may affect device reliability. 1. limited by maximum junction temperature 2. i d 10.5 a, di/dt 200 a/ s, v dd bv dss , t j 150 c. n ? channel marking diagram a = location code y = year ww = work week g, h = pb ? free, halogen ? free package http://onsemi.com v dss r ds(on) (max) @ 4.5 a 500 v 0.52 NDF11N50ZG or ndf11n50zh ayww gate source drain NDF11N50ZG to ? 220fp case 221d ndf11n50zh to ? 220fp case 221ah g (1) d (2) s (3) see detailed ordering and shipping information in the package dimensions section on page 6 of this data sheet. ordering information
ndf11n50z http://onsemi.com 2 thermal resistance parameter symbol ndf11n50z unit junction ? to ? case (drain) r jc 3.2 c/w junction ? to ? ambient steady state (note 3) r ja 50 electrical characteristics (t j = 25 c unless otherwise noted) characteristic test conditions symbol min typ max unit off characteristics drain ? to ? source breakdown voltage v gs = 0 v, i d = 1 ma bv dss 500 v breakdown voltage temperature coefficient reference to 25 c, i d = 1 ma bv dss / t j 0.6 v/ c drain ? to ? source leakage current v ds = 500 v, v gs = 0 v 25 c i dss 1 a 125 c 50 gate ? to ? source forward leakage v gs = 20 v i gss 10 a on characteristics (note 4) static drain ? to ? source on ? resistance v gs = 10 v, i d = 4.5 a r ds(on) 0.48 0.52 gate threshold voltage v ds = v gs , i d = 100 a v gs(th) 3.0 3.9 4.5 v forward transconductance v ds = 15 v, i d = 4.5 a g fs 7.7 s dynamic characteristics input capacitance (note 5) v ds = 25 v, v gs = 0 v, f = 1.0 mhz c iss 1097 1375 1645 pf output capacitance (note 5) c oss 132 166 199 reverse transfer capacitance (note 5) c rss 30 40 50 total gate charge (note 5) v dd = 250 v, i d = 10.5 a, v gs = 10 v q g 23 46 69 nc gate ? to ? source charge (note 5) q gs 4.5 8.7 13 gate ? to ? drain (?miller?) charge (note 5) q gd 12.5 25 37.5 plateau voltage v gp 6.2 v gate resistance r g 1.4 resistive switching characteristics turn ? on delay time v dd = 250 v, i d = 10.5 a, v gs = 10 v, r g = 5 t d(on) 15 ns rise time t r 32 turn ? off delay time t d(off) 40 fall time t f 23 source ? drain diode characteristics (t c = 25 c unless otherwise noted) diode forward voltage i s = 10.5 a, v gs = 0 v v sd 1.6 v reverse recovery time v gs = 0 v, v dd = 30 v i s = 10.5 a, di/dt = 100 a/ s t rr 310 ns reverse recovery charge q rr 2.5 c 3. insertion mounted 4. pulse width 380 s, duty cycle 2%. 5. guaranteed by design.
ndf11n50z http://onsemi.com 3 typical characteristics 0 5 10 15 20 25 0 5 10 15 20 25 v ds , drain ? to ? source voltage (v) i d , drain current (a) figure 1. on ? region characteristics 7.0 v 6.5 v 6.0 v 5.5 v 5.0 v v gs = 10 v 0 5 10 15 20 25 345678910 v gs , gate ? to ? source voltage (v) i d , drain current (a) figure 2. transfer characteristics v ds = 25 v t j = 150 c t j = ? 55 c t j = 25 c 0.40 0.45 0.50 0.55 0.60 0.65 0.70 0.75 0.80 0.85 0.90 0.95 1.00 5.5 6.0 6.5 7.0 7.5 8.0 8.5 9.0 9.5 10.0 v gs , gate ? to ? source voltage (v) r ds(on) , drain ? to ? source resistance ( ) figure 3. on ? region versus gate ? to ? source voltage i d = 4.5 a t j = 25 c 0.40 0.45 0.50 0.55 0.60 0.65 0.70 0.75 0.80 0.85 0.90 0.95 1.00 01234567891011 t j = 25 c i d , drain current (a) figure 4. on ? resistance versus drain current and gate voltage r ds(on) , drain ? to ? source resistance ( ) v gs = 10 v 0.25 0.50 0.75 1.00 1.25 1.50 1.75 2.00 2.25 2.50 2.75 ? 50 ? 25 0 25 50 75 100 125 150 r ds(on) , drain ? to ? source resistance (normalized) i d = 4.5 a v gs = 10 v t j , junction temperature ( c) figure 5. on ? resistance variation with temperature 0.90 0.95 1.00 1.05 1.10 1.15 50 25 0 25 50 75 100 125 150 t j , junction temperature ( c) figure 6. bv dss variation with temperature bv dss , normalized breakdown voltage (v) i d = 1 ma
ndf11n50z http://onsemi.com 4 typical characteristics 0.1 1 10 100 0 50 100 150 200 250 300 350 400 450 500 v ds , drain ? to ? source voltage (v) i dss , leakage ( a) figure 7. drain ? to ? source leakage current versus voltage t j = 150 c t j = 125 c 0 250 500 750 1000 1250 1500 1750 2000 2250 2500 2750 3000 3250 0.01 0.1 1 10 100 v ds , drain ? to ? source voltage (v) c, capacitance (pf) figure 8. capacitance variation t j = 25 c v gs = 0 v f = 1 mhz c iss c oss c rss 0 50 100 150 200 250 300 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 0 5 10 15 20 25 30 35 40 45 50 q g , total gate charge (nc) figure 9. gate ? to ? source voltage and drain ? to ? source voltage versus total charge v gs , gate ? to ? source voltage (v) v ds , drain ? to ? source voltage (v) q gd v ds = 250 v i d = 10.5 a t j = 25 c v ds v gs q t q gs 1 10 100 1000 1 10 100 r g , gate resistance ( ) t, time (ns) v dd = 250 v i d = 10.5 a v gs = 10 v t d(off) t d(on) t f t r figure 10. resistive switching time variation versus gate resistance 0.1 1 10 20 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0 1.1 1.2 125 c t j = 150 c 25 c ? 55 c v sd , source ? to ? drain voltage (v) figure 11. diode forward voltage versus current i s , source current (a)
ndf11n50z http://onsemi.com 5 typical characteristics v ds , drain ? to ? source voltage (v) i d , drain current (a) figure 12. maximum rated forward biased safe operating area ndf11n50z v gs 30 v single pulse t c = 25 c 10 s 100 s 10 ms dc 1 ms r ds(on) limit thermal limit package limit pulse time (s) duty cycle = 0.5 single pulse r(t) (c/w) figure 13. thermal impedance (junction ? to ? case) for ndf11n50z r jc = 3.2 c/w steady state 0.2 0.1 0.05 0.02 0.01 1e ? 06 1e ? 05 1e ? 04 1e ? 03 1e ? 02 1e ? 01 1e+00 1e+01 1e+02 1e+03 0.01 0.1 1 10 100 0.1 1 10 100 1000 0.001 0.01 0.1 1 10 leads heatsink 0.110 min figure 14. isolation test diagram measurement made between leads and heatsink with all leads shorted together. *for additional mounting information, please download the on semiconductor soldering and mounting techniques reference manual, solderrm/d.
ndf11n50z http://onsemi.com 6 ordering information order number package shipping NDF11N50ZG to ? 220fp (pb ? free, halogen ? free) 50 units / rail ndf11n50zh to ? 220fp (pb ? free, halogen ? free) 50 units / rail
ndf11n50z http://onsemi.com 7 package dimensions to ? 220fp case 221d ? 03 issue k dim a min max min max millimeters 0.617 0.635 15.67 16.12 inches b 0.392 0.419 9.96 10.63 c 0.177 0.193 4.50 4.90 d 0.024 0.039 0.60 1.00 f 0.116 0.129 2.95 3.28 g 0.100 bsc 2.54 bsc h 0.118 0.135 3.00 3.43 j 0.018 0.025 0.45 0.63 k 0.503 0.541 12.78 13.73 l 0.048 0.058 1.23 1.47 n 0.200 bsc 5.08 bsc q 0.122 0.138 3.10 3.50 r 0.099 0.117 2.51 2.96 s 0.092 0.113 2.34 2.87 u 0.239 0.271 6.06 6.88 seating plane ? t ? u c s j r notes: 1. dimensioning and tolerancing per ansi y14.5m, 1982. 2. controlling dimension: inch 3. 221d-01 thru 221d-02 obsolete, new standard 221d-03. ? b ? ? y ? g n d l k h a f q 3 pl 123 m b m 0.25 (0.010) y to ? 220 fullpack, 3 ? lead case 221ah issue d dim min max millimeters d 14.70 15.30 e 9.70 10.30 a 4.30 4.70 b 0.54 0.84 p 3.00 3.40 e l1 --- 2.10 c 0.49 0.79 l 12.70 14.73 b2 1.10 1.40 q 2.80 3.20 a2 2.50 2.70 a1 2.50 2.90 h1 6.70 7.10 e q l1 b2 e d l p 123 b seating plane a a1 h1 a2 c notes: 1. dimensioning and tolerancing per asme y14.5m, 1994. 2. controlling dimension: millimeters. 3. contour uncontrolled in this area. 4. dimensions d and e do not include mold flash and gate protrusions. mold flash and gate protrusions not to exceed 0.13 per side. these dimensions are to be measured at outermost extreme of the plastic body. 5. dimension b2 does not include dambar protrusion. lead width including protrusion shall not exceed 2.00. 2.54 bsc m 0.14 m a a b c e/2 m 0.25 m a b 3x c 3x b note 3 on semiconductor and are registered trademarks of semiconductor co mponents industries, llc (scillc). scillc owns the rights to a numb er of patents, trademarks, copyrights, trade secrets, and other intellectual property. a list ing of scillc?s product/patent coverage may be accessed at ww w.onsemi.com/site/pdf/patent ? marking.pdf. scillc reserves the right to make changes without further notice to any products herein. scillc makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does scillc assume any liability arising out of the application or use of any product or circuit, and s pecifically disclaims any and all liability, including without limitation special, consequential or incidental damages. ?typical? parameters which may be provided in scillc data sheets and/ or specifications can and do vary in different applications and actual performance may vary over time. all operating parame ters, including ?typicals? must be validated for each customer application by customer?s technical experts. scillc does not convey any license under its patent rights nor the right s of others. scillc products are not designed, intended, or a uthorized for use as components in systems intended for surgical implant into the body, or other applications intended to support or sustain life, or for any other application in whic h the failure of the scillc product could create a situation where personal injury or death may occur. should buyer purchase or us e scillc products for any such unintended or unauthorized appli cation, buyer shall indemnify and hold scillc and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unin tended or unauthorized use, even if such claim alleges that scil lc was negligent regarding the design or manufacture of the part. scillc is an equal opportunity/affirmative action employer. this literature is subject to all applicable copyrig ht laws and is not for resale in any manner. publication ordering information n. american technical support : 800 ? 282 ? 9855 toll free usa/canada europe, middle east and africa technical support: phone: 421 33 790 2910 japan customer focus center phone: 81 ? 3 ? 5817 ? 1050 ndf11n50z/d literature fulfillment : literature distribution center for on semiconductor p.o. box 5163, denver, colorado 80217 usa phone : 303 ? 675 ? 2175 or 800 ? 344 ? 3860 toll free usa/canada fax : 303 ? 675 ? 2176 or 800 ? 344 ? 3867 toll free usa/canada email : orderlit@onsemi.com on semiconductor website : www.onsemi.com order literature : http://www.onsemi.com/orderlit for additional information, please contact your local sales representative
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